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Showing 1 - 6 of 6 Results
1.
VLSI Test Principles And Architectures Design for Testability
VLSI Test Principles And Architectures Design for Testability by Wang, Laung-Terng, Wu, Chen... ISBN: 9780123705976 List Price: $77.95
$54.36 (Save 30%)
2.
Electronic Design Automation
Electronic Design Automation by Wang, Laung-Terng, Wang, La... ISBN: 9780123743640 List Price: $89.95
$107.90
3.
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability by Wang, Laung-Terng, Touba, N... ISBN: 9780123739735 List Price: $72.95

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4.
VLSI Test Principles and Architectures: Design for Testability
VLSI Test Principles and Architectures: Design for Testability by Laung-Terng Wang, Cheng-Wen... ISBN: 9781493300860 List Price: $89.95

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5.
System-on-chip Test Architectures: Nanometer Design for Testability
System-on-chip Test Architectures: Nanometer Design for Testability by Stroud, Charles, Wang, Laun... ISBN: 9780080556802

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6.
Vlsi Test Principles and Architectures: Design for Testability
Vlsi Test Principles and Architectures: Design for Testability by Wang, Laung-terng, Wen, Xia... ISBN: 9780080474793

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