4791098
9780123705976
VLSI Test Principles And Architectures Design for Testability
by Wang, Laung-Terng, Wu, Cheng-Wen, Wen, Xiaoqing
465888
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About this item
- Condition: Good
- Provider: Ergode New Condition Contact
- Provider Rating: 0%
- Ships From: Houston, TX
- Shipping: Standard
- Comments: Buy with confidence. Excellent Customer Service & Return policy.
Product details
- ISBN-13: 9780123705976
- ISBN: 0123705975
- Publication Date: 2006
- Publisher: Morgan Kaufmann Pub
AUTHOR
SUMMARY
Covering VLSI testing from digital, analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits, this edited work discusses future test technology trends and challenges facing the nanometer design era, including how to deal with physical failures and soft errors.Wang, Laung-Terng is the author of 'VLSI Test Principles And Architectures Design for Testability', published 2006 under ISBN 9780123705976 and ISBN 0123705975.
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