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Showing 1 - 6 of 6 Results
1.
VLSI Test Principles And Architectures Design for Testability
VLSI Test Principles And Architectures Design for Testability by Wang, Laung-Terng, Wu, Chen... ISBN: 9780123705976 List Price: $77.95
$54.36 (Save 30%)
2.
Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices by Girard, Patrick, Nicolici, ... ISBN: 9781441909275 List Price: $169.00
$158.63 (Save 6%)
3.
VLSI Test Principles and Architectures: Design for Testability
VLSI Test Principles and Architectures: Design for Testability by Laung-Terng Wang, Cheng-Wen... ISBN: 9781493300860 List Price: $89.95

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4.
Unterwegs
Unterwegs by Ye Mi, Fan Wen, Huang Tulu,... ISBN: 9783941651005

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5.
Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices by Girard, Patrick, Nicolici, ... ISBN: 9781441909282

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6.
Vlsi Test Principles and Architectures: Design for Testability
Vlsi Test Principles and Architectures: Design for Testability by Wang, Laung-terng, Wen, Xia... ISBN: 9780080474793

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