1.
System-on-Chip Test Architectures: Nanometer Design for Testability
by Wang, Laung-Terng, Touba, N...
ISBN: 9780123739735
List Price: $72.95
OUT OF STOCK
See Availability on Amazon2.
System-on-chip Test Architectures: Nanometer Design for Testability
by Stroud, Charles, Wang, Laun...
ISBN: 9780080556802