1803014
9780122341229
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As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging. Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualificationSabnis, Anant G. is the author of 'Vlsi Reliability' with ISBN 9780122341229 and ISBN 0122341228.
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