2090524
9780819451538
Out of Stock
The item you're looking for is currently unavailable.
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.Batchelor, Bruce G. is the author of 'Two-And Three-Dimensional Vision Systems for Inspection, Control and Metrology', published 2004 under ISBN 9780819451538 and ISBN 0819451533.
[read more]