Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures Symposium Held December 2-6, 2002, Boston, Massachusetts, U.S.A

A primary driver of progress in nanoscience and technology is the continuing advances in the ability to measure structure, and particularly properties, at spatially localized scales. Combinations of new techniques and significant advances in well-known microscopies continue to provide new insight into mechanisms at play in areas as diverse as optoelectronics, spintronics, protein dynamics and biomolecular recognition. Some of the most remarkable progress involves spatially resolved optical techniques such as cathodoluminescence, micro-Raman and fluorescence spectroscopy in near scanning optical microscopy, as well as the development of new scanning probe microscopies/spectroscopies and cantilever-based measurements. From the point of view of characterization, it is worth mentioning advances in the interpretation of processes in semiconductors, the ability to observe and manipulate metal, carbon and silicon nanowires and nanodots, and studies in molecular self assembly. The papers in this volume fall into two categories--those addressing classes of characterization techniques that emphasize how the combination of theoretical, experimental, and instrumentational developments lead to new capabilities in nanoscale characterization, and those focused on the use of various spatially localized approaches on a single phenomenon or materials issue.Piqueras, Javier is the author of 'Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures Symposium Held December 2-6, 2002, Boston, Massachusetts, U.S.A' with ISBN 9781558996755 and ISBN 1558996753.