1568751

9780780310001

Semiconductor Memories Technology, Testing, and Reliability

Semiconductor Memories Technology, Testing, and Reliability
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  • ISBN-13: 9780780310001
  • ISBN: 0780310004
  • Publisher: Wiley & Sons, Incorporated, John

AUTHOR

Sharma, Ashok K.

SUMMARY

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.Sharma, Ashok K. is the author of 'Semiconductor Memories Technology, Testing, and Reliability' with ISBN 9780780310001 and ISBN 0780310004.

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