Secondary Ion Mass Spectrometry SIMS Eight: Proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry

Partial table of contents: FUNDAMENTALS. Doubly Charged Ions of Fourth Row Elements (S. Schauer & P. Williams). QUANTIFICATION. Energy Distributions: A Tool for Quantitative Analysis (K. Elst, et al.). INSTRUMENTATION. Custom-Built Quadrupole SIMS for Material Analysis (C. Pagura, et al.). SURFACE ANALYSIS. Time-of-Flight SIMS (E. Niehuis). DEPTH PROFILING. SIMS Measurements of Ion Beam Mixing in Silver (B. King, et al.). IMAGING. Three-Dimensional Visualization of Secondary Ion Images (J. Lee, et al.). POSITIONIZATION. Photoion Detection Using Two Different Types of Mass Analyzer (T. Maruo, et al.). COMBINED AND/OR RELATED TECHNIQUES. Depth Profiling of Coated Steel Wires by GDMS (M. van Straaten & R. Gijbels). BIOLOGY. Biological Ion Microscopy: Challenges and Future Prospects (G. Morrison & S. Chandra). ISOTOPIC ANALYSIS--GEOLOGY. Study of the Variability in Isotopic Analyses (A. Adriaens & F. Adams). METALS AND OXIDES. Lateral Profiling of Solute Depletion in Al-Li Alloys by SIMS (D. Newbury, et al.). POLYMERS--ORGANICS. Polymer Analysis: Combined Techniques (B. Ratner, et al.). SEMICONDUCTORS. Mapping of B-Channeling by SIMS (C. Tian, et al.). List of Contributors. Index of Reviewers. Index of Chairpersons.Benninghoven, A. is the author of 'Secondary Ion Mass Spectrometry SIMS Eight: Proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry', published 1992 under ISBN 9780471930648 and ISBN 0471930644.