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9780769519517
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The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the World, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind. ATS 2003's papers shares state-of-the-art ideas and technologies in testing.IEEE Computer Society Staff is the author of 'Proceedings 12th Asian Test Symposium Ats 2003', published 2003 under ISBN 9780769519517 and ISBN 0769519512.
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