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36667098

9783659001987

Optical Admittance Loci Monitoring for Thin Film Deposition: Optical Monitoring for Thin Film Coatings

Optical Admittance Loci Monitoring for Thin Film Deposition: Optical Monitoring for Thin Film Coatings
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Product details

  • ISBN-13: 9783659001987
  • ISBN: 3659001988
  • Publication Date: 2012
  • Publisher: LAP LAMBERT Academic Publishing

AUTHOR

Cheng-Chung Lee, Kai Wu, Tzu-Ling Ni

SUMMARY

Cheng-Chung Lee is the author of 'Optical Admittance Loci Monitoring for Thin Film Deposition: Optical Monitoring for Thin Film Coatings', published 2012 under ISBN 9783659001987 and ISBN 3659001988.

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