Metrology for Radio-Frequency Technology A Bibliography

Lists the publications by the staff of the Radio-Frequency Tech. Div. (RFTD) of NIST for the period Jan. 1970 through July 1999. Selected earlier publications from the Division's predecessor org. are included. Programs of the RFTD include metrology for the fundamental microwave quantities such as power, noise, impedance, & scattering parameters; standards & metrology for wireless systems; gain, pattern, & polarization measurements for antennas; electromagnetic properties of materials; measurements for high speed microelectronics; electromagnetic field characterization & electromagnetic compatibility.Lyons, Ruth M. is the author of 'Metrology for Radio-Frequency Technology A Bibliography' with ISBN 9780756706159 and ISBN 0756706157.