Materials Science and Technology, Characterization of Materials Part II

Materials Science and Technology A Comprehensive Treatment Edited by R.W Cahn, P. Haasen, E.J. Kramer The 18 volume series 'Materials Science and Technology' is the first in-depth, topic-oriented reference work devoted to this growing interdisciplinary field. A compendium of current, state-of-the-art information, it covers the most important classes of materials: metals, ceramics, glasses, polymers, semiconductors, and composites. Each volume deals with properties, processing, applications, or general phenomena associated with these materials. Edited by internationally renowned figures in materials science, this series is sure to establish itself as a seminal work. Volume 2B: This is the second part of a two-part volume focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers, and ceramics. Topics include: STM - mechanical spectroscopy - scanning Auger microscopy - acoustic microscopy - microstructure analysis - electron microprobe analysis - high energy ion beam analysis - field ion microscopy - neutron diffraction - small-angle scattering of X-rays and neutrons - characterizing polymer surfaces, interfaces, and thin filmsLifshin, Eric is the author of 'Materials Science and Technology, Characterization of Materials Part II ' with ISBN 9783527282654 and ISBN 3527282653.