Materials Reliability in Microelectronics V

This long-standing proceedings series is highly regarded as a premier forum for the discussion of microelectronics reliability issues. In this 5th volume, emphasis is on the fundamental understanding of failure phenomena in thin-film materials. Special attention is given to electromigration and mechanical stress effects. The reliability of thin dielectrics and hot carrier degradation of transistors are also featured.Oates, Anthony S. is the author of 'Materials Reliability in Microelectronics V' with ISBN 9781558992948 and ISBN 1558992944.