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6472841

9780262561990

Logic Testing and Design for Testability

Logic Testing and Design for Testability
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Product details

  • ISBN-13: 9780262561990
  • ISBN: 0262561999
  • Publication Date: 1985
  • Publisher: MIT Press

AUTHOR

Fujiwara, Hideo

SUMMARY

Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.Fujiwara, Hideo is the author of 'Logic Testing and Design for Testability', published 1985 under ISBN 9780262561990 and ISBN 0262561999.

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