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26045870

9781441923073

High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures

High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
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Product details

  • ISBN-13: 9781441923073
  • ISBN: 1441923071
  • Edition: 2
  • Publication Date: 2011
  • Publisher: Springer

AUTHOR

Pietsch, Ullrich, Holy, Vaclav, Baumbach, Tilo

SUMMARY

Pietsch, Ullrich is the author of 'High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures', published 2011 under ISBN 9781441923073 and ISBN 1441923071.

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