Dislocations and Deformation Mechanisms in Thin Films and Small Structures Symposium Held April 17-19, 2001, San Francisco, California, U.S.A

The mechanical properties of small volumes of materials such as thin films and patterned structures (lines, dots) can be very different from the mechanical properties of those same materials in bulk. Many explanations of the mechanical behaviors of such small volumes have depended on simplified models of dislocation behavior. However, recent developments in dislocation modeling have made it possible to describe and understand dislocation behavior in much more detail than ever before. A wide range of topics is presented in this proceedings collection, including mechanisms of plastic deformation in heteroepitaxial, multilayered and polycrystalline thin films, as well as three-dimensional mesostructures such as epitaxial islands, semiconducting devices and microcrystallites. Experimental, theoretical and numerical simulations are addressed.Kraft, O. is the author of 'Dislocations and Deformation Mechanisms in Thin Films and Small Structures Symposium Held April 17-19, 2001, San Francisco, California, U.S.A' with ISBN 9781558996090 and ISBN 1558996095.