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9780471851356
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Faults and Failure Mechanisms. Digital Testing Overview. Stimulus Generation. Expected Response Determination. Circuit and Fault Modeling. Automatic Test Equipment. Device-Under-Test Interface. ATE Languages. Diagnostics and Troubleshooting Aids. Memory Testing. Design for Testability. Test Planning. Glossary. Index.Cortner, J. Max is the author of 'Digital Test Engineering', published 1987 under ISBN 9780471851356 and ISBN 0471851353.
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