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9780387717531

Digital Noise Monitoring of Defect Origin

Digital Noise Monitoring of Defect Origin
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  • ISBN-13: 9780387717531
  • ISBN: 0387717536
  • Publication Date: 2007
  • Publisher: Springer

AUTHOR

Aliev, Telman

SUMMARY

Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.Aliev, Telman is the author of 'Digital Noise Monitoring of Defect Origin', published 2007 under ISBN 9780387717531 and ISBN 0387717536.

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