4078518
9780521019934
Tien Tsong presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.Tsong, Tien T. is the author of 'Atom-probe Field Ion Microscopy Field Ion Emission And Surfaces And Interfaces at Atomic Resolution', published 2005 under ISBN 9780521019934 and ISBN 0521019931.
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