21st IEEE Vlsi Test Symposium, Vts 2003

VTS 2003 is the twenty-first in a series of annual symposia that explore the state-of-the-art, and introduce innovative approaches, in the testing of electronic circuits and systems. The complexity of current generation ICs, combined with rapidly developing high density, high speed packaging and reduced design cycle time, has made it extremely difficult and expensive to comprehensively test electronic systems, and diagnose failed parts using traditional methods. This situation worsens as we move toward nanometer technologies.IEEE Computer Society Staff is the author of '21st IEEE Vlsi Test Symposium, Vts 2003' with ISBN 9780769519241 and ISBN 0769519245.