1.
C, H, n and O in SI and Characterization and Simulation of Materials and Processes: Proceedi...
by Borghesi, A., Gosele, U. M....
ISBN: 9780444824134
List Price: $273.00
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Gettering and Defect Engineering in Semiconductor Technology
by Claeys, C., Vanhellemont, J...
ISBN: 9783908450276