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Showing 1 - 4 of 4 Results
1.
Nondestructive Testing Overview
Nondestructive Testing Overview by Ness, Stanley, Sherlock, Ch... ISBN: 9781571170187 List Price: $97.25

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2.
Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy
Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy by Stanley J. Ness ISBN: 9781286862377 List Price: $49.00
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3.
Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy
Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy by Air Force Inst of Tech Wrig... ISBN: 9781423504269 List Price: $31.95

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4.
Visual and Optical Testing
Visual and Optical Testing by Allgaier, Michael W., Ness,... ISBN: 9780931403057 List Price: $121.25

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