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Showing 1 - 3 of 3 Results
1.
Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Spring...
Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Spring... by Breitenstein, O., Warta, Wi... ISBN: 9783642024160 List Price: $129.00
$78.90 (Save 38%)
2.
Beam Injection Assessment of Defects in Semiconductors
Beam Injection Assessment of Defects in Semiconductors by Kittler, M., Breitenstein, ... ISBN: 9783908450399

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3.
Lock-In Thermography Basics and Use for Functional Diagnostics of Electronic Components
Lock-In Thermography Basics and Use for Functional Diagnostics of Electronic Components by Breitenstein, O., Langenkam... ISBN: 9783540434399 List Price: $169.00

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